Design Guidelines: Test Capabilities
Unlike most thin-film manufacturing companies, Knowles Precision Devices offers full DC-40 GHz Automatic Network Analyzer (AGILENT 8510) test capability.
Our engineering staff can create fixtures or perform wafer probing to ensure a compliant design the first time and every time in production. Full S-parameter data or TDR plots can be provided.
Our RF Testing lab contains a number of thin film substrate and module test fixtures that can be configured to perform non-destructive RF tests on substrates. These fixtures are adjustable in X, Y and Z directions and can support multiple input/output configurations.
Typical measurements include:
- Edge coupled filters
- Microstrip to Coplanar Waveguide (CPW) transitions
- Equalizers
- Couplers and Splitters
- Open/short continuity testing
- Microstrip, CPW and Coupled line impedances
- TDR Line measurements (Impedance, discontinuities, terminations etc.)
- Attenuator Impedance and Attenuation value testing (DC and RF)